Probstation

is used to physically acquire signals from the internal nodes of a semiconductor device. The probe station utilizes manipulators which allow the precise positioning of thin needles on the surface of a semiconductor device. If the device is being electrically stimulated, the signal is acquired by the mechanical probe and is displayed on an oscilloscope or SMU. The mechanical probe station is often used in the failure analysis of semiconductor devices.

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Labnonstop performs research and development on scientific startups and specialized in micro and nano fabrication, elecro analysis and storage, synthetic chemistry, nano materials, physical and chemical analysis, mechanical and laser process, culture Cells, 3D printing.


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