Atomic Force Microscopy And Raman Analysis(Afm)

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Atomic Force Microscopy And Raman Analysis(Afm)

Details

A type of scanning with very high resolution.more than 1000 times better than the optical diffraction limit,this equipment can provide physical sample information on the nanometer scale, including topography, hardness, adhesion, friction, surface potential, electrical and thermal conductivity and temperature.

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